Thursday, November 2, 2017

Webinar update: “Addressing safety challenges in full digital instrument clusters”

Martin Riedl

On October 18, Yi Zheng, Product Manager, QNX and I presented a webinar on how our combined solutions, the QNX Platform for Instrument Clusters and Elektrobit’s EB GUIDE, address safety challenges in digital instrument clusters. The webinar described the design complexity of digital instrument clusters related to embedded graphics, the new set of challenges that developing full digital instrument clusters pose, and finally outlined how one can solve the functional safety requirements imposed on critical information on the cluster, such as telltales and gear positions.

If you missed the webinar or would like to watch a part of it again, you can access it on-demand.